Single-cell level investigation of microbiologically induced degradation of passive film of stainless steel via FIB-SEM/TEM and multi-mode AFM.

The degradation of passive films of a stainless steel by S. algae was investigated at the single-cell level. The focused ion beam-scanning/transmission electron microscopy showed that the passive film underneath the adherent S. algae cell was significantly thinner than that without bacterial coverage after 3 days of inoculation. Atomic force microscopy (AFM) in the nano manipulation mode was used to move the bacterial cell and AFM in the dynamic mode revealed the nanoscale corrosion pit underneath. Peak force tapping-frequency modulation mode of AFM showed high Volta potentials at the pit center and low Volta potentials around the bacterial cell. • FIB-SEM/TEM and multimode AFM are used to study MIC at the single-cell level. • FIB-SEM/TEM shows degradation of stainless steel passive film by a S. algae cell. • Multimode AFM is used to investigate pitting corrosion underneath a S. algae cell. [ABSTRACT FROM AUTHOR]