Impact of Externally Induced Local Mechanical Stress on Electrical Performance of Decananometer MOSFETs.

MLA

Lee, Kookjin, et al. “Impact of Externally Induced Local Mechanical Stress on Electrical Performance of Decananometer MOSFETs.” IEEE Transactions on Electron Devices, vol. 69, no. 9, Sept. 2022, pp. 5382–85. EBSCOhost, https://doi.org/10.1109/TED.2022.3193023.

APA

Lee, K., Kaczer, B., Kruv, A., Gonzalez, M., Eneman, G., Okudur, O. O., Grill, A., & De Wolf, I. (2022). Impact of Externally Induced Local Mechanical Stress on Electrical Performance of Decananometer MOSFETs. IEEE Transactions on Electron Devices, 69(9), 5382–5385. https://doi.org/10.1109/TED.2022.3193023

Chicago

Lee, Kookjin, Ben Kaczer, Anastasiia Kruv, Mario Gonzalez, Geert Eneman, Oguzhan Orkut Okudur, Alexander Grill, and Ingrid De Wolf. 2022. “Impact of Externally Induced Local Mechanical Stress on Electrical Performance of Decananometer MOSFETs.” IEEE Transactions on Electron Devices 69 (9): 5382–85. doi:10.1109/TED.2022.3193023.