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Insights into the dual Z-scheme and piezoelectricity co-driven photocatalyst for ultra-speed degradation of nitenpyram.
- Source :
-
Chemical Engineering Journal . Jan2023:Part 1, Vol. 451, pN.PAG-N.PAG. 1p. - Publication Year :
- 2023
-
Abstract
- [Display omitted] • Improved activity by synergy of Z-scheme and piezoelectricity was firstly proposed. • The promotion mechanism of piezoelectricity on dual Z-scheme is explained. • The prepared material has strong anti-interference ability. • The degradation path of nitenpyram is explained in detail. • The toxicity of NTP's intermediate products was also analyzed. A highly active catalyst AgI/Ag 3 PO 4 /BaTiO 3 with the synergistic effect of photocatalysis and piezoelectricity was prepared, which can remove 100 % of Nitenpyram (NTP) in a wide pH range within 10 min. This piezo-photocatalyst AgI/Ag 3 PO 4 /BaTiO 3 with dual Z-scheme shows a higher NTP degradation rate than their mono-material and binary composites. The apparent rate constant of AgI/Ag 3 PO 4 /BaTiO 3 in NTP removal is 2.12 times higher than the second-performing catalyst. In the quenching experiment, h+ and ·O 2 – were observed to be the main active substance in NTP degradation and the former contributes the most. The dual Z-scheme mechanism and the built-in electric field are both beneficial for the separation of electron-hole pairs, as well as the extension of the photo-generated carrier lifetime. At last, the effect factor experiments proved that the prepared AgI/Ag 3 PO 4 /BaTiO 3 catalyst owns stable and efficient activity. This work provides novel guidance for the construction of highly efficient and stable piezo-photocatalytic heterojunction catalysts. [ABSTRACT FROM AUTHOR]
- Subjects :
- *ELECTRIC fields
*PHOTOCATALYSIS
*PIEZOELECTRICITY
*HETEROJUNCTIONS
*CATALYSTS
Subjects
Details
- Language :
- English
- ISSN :
- 13858947
- Volume :
- 451
- Database :
- Academic Search Index
- Journal :
- Chemical Engineering Journal
- Publication Type :
- Academic Journal
- Accession number :
- 159564731
- Full Text :
- https://doi.org/10.1016/j.cej.2022.138399