Numerical simulation and design of ferritic stainless steel bolted T-stubs in tension.

Following the experimental study on EN 1.4003 ferritic stainless steel T-stubs in tension discussed in the companion paper, this study reports the development and validation of an advanced FE model that can predict the overall behaviour and failure modes of ferritic stainless steel bolted T-stubs subjected to tension. Key simulation strategies regarding the modelling of bolt geometry and overcoming numerical instabilities are discussed. Following the determination of material properties in the longitudinal, transverse and diagonal direction reported in the companion paper, the effect of allowing for anisotropy in the FE simulations is investigated and modelling recommendations for its inclusion in FE models are made. Moreover, the effect of bolt end and edge spacing on the joint plastic resistance, ultimate capacity, ductility as well as overall response is comprehensively discussed by inspecting the stress distribution through the plate thickness at various locations along the T-stub, thus revealing both the flexural and the membrane component of the load transfer mechanism. The numerical results were validated against the experimental results reported in the companion paper in terms of predicted plastic and ultimate resistance, ductility and obtained failure modes. On the basis of the obtained results and the discussion, modelling recommendations for the simulation of stainless steel T-stubs are made. • An advanced numerical study on austenitic, duplex and ferritic stainless steel bolted T-stubs under tension was reported. • The effect of material anisotropy on the plastic and ultimate resistance of stainless steel bolted T-stubs was reported. • Damage initiation model with instantaneous fracture was proposed and validated against the test results. • Membrane action on the ultimate resistance of stainless steel T-stubs have been examined. • Newly proposed design methods for predicting the ultimate resistance of stainless steel T-stubs have been verified. [ABSTRACT FROM AUTHOR]