Cite
Measurement method of the IGBT chip temperature fluctuation based on electrothermal model derivation.
MLA
Li, Lie, et al. “Measurement Method of the IGBT Chip Temperature Fluctuation Based on Electrothermal Model Derivation.” Microelectronics Journal, vol. 130, Dec. 2022, p. N.PAG. EBSCOhost, https://doi.org/10.1016/j.mejo.2022.105613.
APA
Li, L., He, Y., & Du, B. (2022). Measurement method of the IGBT chip temperature fluctuation based on electrothermal model derivation. Microelectronics Journal, 130, N.PAG. https://doi.org/10.1016/j.mejo.2022.105613
Chicago
Li, Lie, Yigang He, and Bolun Du. 2022. “Measurement Method of the IGBT Chip Temperature Fluctuation Based on Electrothermal Model Derivation.” Microelectronics Journal 130 (December): N.PAG. doi:10.1016/j.mejo.2022.105613.