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Design for Reliability of SiC-MOSFET-Based 1500-V PV Inverters With Variable Gate Resistance.

Authors :
He, Jinkui
Sangwongwanich, Ariya
Yang, Yongheng
Zhang, Kaichen
Iannuzzo, Francesco
Source :
IEEE Transactions on Industry Applications. Sep/Oct2022, Vol. 58 Issue 5, p6485-6495. 11p.
Publication Year :
2022

Abstract

1500-V photovoltaic (PV) configuration is the standard design in the solar PV industry. Extending the maximum dc voltage from 1000 to 1500 V can reduce the installation cost of the entire power plant. However, it may affect the reliability of the corresponding 1500-V PV inverters, due to the increased loading stresses, i.e., voltage stress and thermal loading of power devices. In this context, this article proposes a solution to the reliability enhancement of silicon carbide-mosfet-based 1500-V PV inverters with variable gate resistance. This solution offers a possibility to adaptively adjust the switching speed to make a compromise between the switching power loss and voltage overshoot during commutation, thus enhancing the reliability. The evaluation results based on the mission profile of a 125-kW 1500-V PV system installed in Denmark indicate that the PV inverter with the proposed design, i.e., variable gate resistance, can improve reliability performance compared to the fixed gate resistance solution while ensuring a safer operating voltage margin. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00939994
Volume :
58
Issue :
5
Database :
Academic Search Index
Journal :
IEEE Transactions on Industry Applications
Publication Type :
Academic Journal
Accession number :
160651554
Full Text :
https://doi.org/10.1109/TIA.2022.3183029