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EM SCA White-Box Analysis-Based Reduced Leakage Cell Design and Presilicon Evaluation.
- Source :
-
IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems . Nov2022, Vol. 41 Issue 11, p4927-4938. 12p. - Publication Year :
- 2022
-
Abstract
- This work presents a white-box modeling of the electromagnetic (EM) leakage from an integrated circuit (IC) to develop EM side-channel analysis (SCA)-aware design techniques. A new digital library cell layout design technique is proposed to minimize the EM leakage and is evaluated using a high-frequency structure simulator (HFSS)-based framework. Backed by our physics-based understanding of EM radiation, the proposed double-row power grid-based digital cell layout design shows $>5\times $ reduction in the EM SCA leakage compared to the traditional digital logic gate layout design. Furthermore, exploiting the magneto-quasistatic (MQS) regime of operation of the EM leakage from the CMOS circuits, the HFSS-based framework is utilized to develop a pre-silicon (Si) EM SCA evaluation technique to assess the vulnerability of cryptographic implementations against such attacks during the design phase itself. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 02780070
- Volume :
- 41
- Issue :
- 11
- Database :
- Academic Search Index
- Journal :
- IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems
- Publication Type :
- Academic Journal
- Accession number :
- 160652648
- Full Text :
- https://doi.org/10.1109/TCAD.2022.3144369