Analysis of Single Event Effects Created by Space Ionizing Radiation in the Microcircuits of the Interplanetary Spacecraft Radio Electronic Equipment.

This paper contains the results of calculation of the rate and number (probability) of random single event effects (upsets and failures) in radio electronic equipment (REE) caused by space ionizing radiation during an interplanetary flight of a spacecraft. Based on the analysis of the results, the criteria for the selection of upset-resistant and failure-resistant integrated circuits in the onboard electronic equipment were determined. [ABSTRACT FROM AUTHOR]