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Comprehensive ESD protection for RF inputs

Authors :
Hyvonen, Sami
Joshi, Sopan
Rosenbaum, Elyse
Source :
Microelectronics Reliability. Feb2005, Vol. 45 Issue 2, p245-254. 10p.
Publication Year :
2005

Abstract

We demonstrate that narrow-band tuned circuits may be used for ESD protection of RF inputs, and a figure of merit for optimization of these circuits is presented. The performance of the ESD-protected RF circuit is dependent on the quality factor of the ESD device, and various protection devices are evaluated in this work. Record-breaking human body model (HBM) protection levels, exceeding 5 kV, have been achieved without significantly degrading the RF performance at 5 GHz. Broadband circuit protection is also addressed. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
00262714
Volume :
45
Issue :
2
Database :
Academic Search Index
Journal :
Microelectronics Reliability
Publication Type :
Academic Journal
Accession number :
16093981
Full Text :
https://doi.org/10.1016/j.microrel.2004.05.012