Back to Search
Start Over
Physical model of a local threshold voltage shift in InGaZnO thin-film transistors under current stress for instability-aware circuit design.
- Source :
-
Current Applied Physics . Feb2023, Vol. 46, p55-60. 6p. - Publication Year :
- 2023
Details
- Language :
- English
- ISSN :
- 15671739
- Volume :
- 46
- Database :
- Academic Search Index
- Journal :
- Current Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 161122026
- Full Text :
- https://doi.org/10.1016/j.cap.2022.11.011