MAKING CONNECTIONS: CHALLENGES AND OPPORTUNITIES FOR IN SITU TEM BIASING.

The article discusses challenges and strategies for producing transmission electron microscopy (TEM)-compatible and electronically viable electronic devices. Topics include the sample preparation process using the Focused ion beam (FIB) technique to create cross-sectioned samples; and highlights the potential of scanning TEM electron beam-induced current as a complement to standard TEM imaging with benefits of high-throughput sample fabrication.