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Analysis of Staggered-Via Loss in Substrate Integrated Waveguide.

Authors :
Kumari, Sheelu
Gupta, Vibha Rani
Srivastava, Shweta
Source :
IETE Journal of Research. Jan2023, Vol. 69 Issue 1, p203-208. 6p.
Publication Year :
2023

Abstract

In this paper, loss due to staggered-via in SIW (Substrate Integrated Waveguide) is analyzed with the help of S-parameter responses and field diagrams. It is observed that staggered-via improves the response of an SIW structure, with higher via pitch (w) to via diameter (d) ratio (w/d), but the loss increases drastically at certain discrete frequencies for which λ / 2 n equals to w, where λ is the guided wavelength corresponding to the frequency and n is any integer value excluding zero. This study will be helpful in choosing between the use of single row of vias or staggered-vias as a sidewall, while designing SIWs at higher frequencies, where it is difficult to use conventional w/d ratio values. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
03772063
Volume :
69
Issue :
1
Database :
Academic Search Index
Journal :
IETE Journal of Research
Publication Type :
Academic Journal
Accession number :
161831779
Full Text :
https://doi.org/10.1080/03772063.2020.1811785