Back to Search Start Over

Interpretation of Reflection and Colorimetry Characteristics of Indium-Particle Films by Means of Ellipsometric Modeling.

Authors :
Zhang, Hao-Tian
He, Rong
Peng, Lei
Yang, Yu-Ting
Sun, Xiao-Jie
Zhang, Yu-Shan
Zheng, Yu-Xiang
Liu, Bao-Jian
Zhang, Rong-Jun
Wang, Song-You
Li, Jing
Lee, Young-Pak
Chen, Liang-Yao
Source :
Nanomaterials (2079-4991). Feb2023, Vol. 13 Issue 3, p383. 14p.
Publication Year :
2023

Abstract

It is of great technological importance in the field of plasmonic color generation to establish and understand the relationship between optical responses and the reflectance of metallic nanoparticles. Previously, a series of indium nanoparticle ensembles were fabricated using electron beam evaporation and inspected using spectroscopic ellipsometry (SE). The multi-oscillator Lorentz–Drude model demonstrated the optical responses of indium nanoparticles with different sizes and size distributions. The reflectance spectra and colorimetry characteristics of indium nanoparticles with unimodal and bimodal size distributions were interpreted based on the SE analysis. The trends of reflectance spectra were explained by the transfer matrix method. The effects of optical constants n and k of indium on the reflectance were demonstrated by mapping the reflectance contour lines on the n-k plane. Using oscillator decomposition, the influence of different electron behaviors in various indium structures on the reflectance spectra was revealed intuitively. The contribution of each oscillator on the colorimetry characteristics, including hue, lightness and saturation, were determined and discussed from the reflectance spectral analysis. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
20794991
Volume :
13
Issue :
3
Database :
Academic Search Index
Journal :
Nanomaterials (2079-4991)
Publication Type :
Academic Journal
Accession number :
161871922
Full Text :
https://doi.org/10.3390/nano13030383