Cite
A von Hamos full-cylindrical spectrometer based on striped Si/Ge crystal for advanced x-ray spectroscopy.
MLA
Guo, Zhiying, et al. “A von Hamos Full-Cylindrical Spectrometer Based on Striped Si/Ge Crystal for Advanced x-Ray Spectroscopy.” Review of Scientific Instruments, vol. 94, no. 2, Feb. 2023, pp. 1–8. EBSCOhost, https://doi.org/10.1063/5.0133896.
APA
Guo, Z., Zhang, Y., Xu, W., Jin, S., Gan, X., Zhang, H., Chen, D., & Jia, Q. (2023). A von Hamos full-cylindrical spectrometer based on striped Si/Ge crystal for advanced x-ray spectroscopy. Review of Scientific Instruments, 94(2), 1–8. https://doi.org/10.1063/5.0133896
Chicago
Guo, Zhiying, Yujun Zhang, Wei Xu, ShuoXue Jin, Xiaolong Gan, Han Zhang, Dongliang Chen, and Quanjie Jia. 2023. “A von Hamos Full-Cylindrical Spectrometer Based on Striped Si/Ge Crystal for Advanced x-Ray Spectroscopy.” Review of Scientific Instruments 94 (2): 1–8. doi:10.1063/5.0133896.