Cite
Coupling model of electromigration and experimental verification – Part I: Effect of atomic concentration gradient.
MLA
Cui, Zhen, et al. “Coupling Model of Electromigration and Experimental Verification – Part I: Effect of Atomic Concentration Gradient.” Journal of the Mechanics & Physics of Solids, vol. 174, May 2023, p. N.PAG. EBSCOhost, https://doi.org/10.1016/j.jmps.2023.105257.
APA
Cui, Z., Fan, X., Zhang, Y., Vollebregt, S., Fan, J., & Zhang, G. (2023). Coupling model of electromigration and experimental verification – Part I: Effect of atomic concentration gradient. Journal of the Mechanics & Physics of Solids, 174, N.PAG. https://doi.org/10.1016/j.jmps.2023.105257
Chicago
Cui, Zhen, Xuejun Fan, Yaqian Zhang, Sten Vollebregt, Jiajie Fan, and Guoqi Zhang. 2023. “Coupling Model of Electromigration and Experimental Verification – Part I: Effect of Atomic Concentration Gradient.” Journal of the Mechanics & Physics of Solids 174 (May): N.PAG. doi:10.1016/j.jmps.2023.105257.