Cite
Atomistic insights into bias-induced oxidation on passivated silicon surface through ReaxFF MD simulation.
MLA
Gao, Jian, et al. “Atomistic Insights into Bias-Induced Oxidation on Passivated Silicon Surface through ReaxFF MD Simulation.” Applied Surface Science, vol. 626, July 2023, p. N.PAG. EBSCOhost, https://doi.org/10.1016/j.apsusc.2023.157253.
APA
Gao, J., Luo, X., Xie, W., Qin, Y., Hasan, R. M. M., & Fan, P. (2023). Atomistic insights into bias-induced oxidation on passivated silicon surface through ReaxFF MD simulation. Applied Surface Science, 626, N.PAG. https://doi.org/10.1016/j.apsusc.2023.157253
Chicago
Gao, Jian, Xichun Luo, Wenkun Xie, Yi Qin, Rashed Md. Murad Hasan, and Pengfei Fan. 2023. “Atomistic Insights into Bias-Induced Oxidation on Passivated Silicon Surface through ReaxFF MD Simulation.” Applied Surface Science 626 (July): N.PAG. doi:10.1016/j.apsusc.2023.157253.