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RoIA: Region of Interest Attention Network for Surface Defect Detection.

Authors :
Liu, Taiheng
Cao, Guang-Zhong
He, Zhaoshui
Xie, Shengli
Source :
IEEE Transactions on Semiconductor Manufacturing. May2023, Vol. 36 Issue 2, p159-169. 11p.
Publication Year :
2023

Abstract

Surface defect detection plays an important role in manufacturing and has aroused widespread interests. However, it is challenging as defects are highly similar to non-defects. To address this issue, this paper proposes a Region of Interest Attention (RoIA) network based on deep learning for automatically identifying surface defects. It consists of three parts: multi-level feature preservation (MFP) module, region proposal attention (RPA) module, and skip dense connection detection (SDCD) ones, where MFP is designed to differentiate defect features and texture information by feature reserved block, RPA is developed to locate the position of the defects by capturing global and local context information, and SDCD is proposed to better predict defect categories by propagating the fine-grained details from low-level feature map to high-level one. Experimental results conducted on three public datasets (e.g., NEU-DET, DAGM and Magnetic-Tile) demonstrate that the proposed method can significantly improve the detection performance than state-of-the-art ones and achieve an average defect detection accuracy of 99.49%. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
08946507
Volume :
36
Issue :
2
Database :
Academic Search Index
Journal :
IEEE Transactions on Semiconductor Manufacturing
Publication Type :
Academic Journal
Accession number :
163545855
Full Text :
https://doi.org/10.1109/TSM.2023.3265987