LQNTL: Low-overhead quadruple-node-upset self-recovery latch based on triple-mode redundancy.

The multiple-node upset (MNU) phenomenon caused by charge sharing increases rapidly in advanced nano-scale latches, making it more critical to design hardened latches for MNU. This paper proposed a low overhead quadruple-node upset self-recoverable latch based on a triple-mode redundancy latch named LQNTL, which consists of three modules with data feedback interlocking within each module to achieve high reliability. Simulation results show that the proposed LQNTL reduces power consumption, delay, PDP, and area by 69.76%, 6.35%, 71.68%, and 10%, respectively, compared to the latest soft-error tolerant latch of the same fault tolerance. The analysis of PVT variation shows that the LQNTL is more stable for the process corner, supply voltage, and temperature variations. • In this paper, a low overhead QNU self-recoverable latch, LQNTL, based on triple-mode redundancy, is proposed to provide complete QNU resilience while maintaining the minimum cost in terms of PDP. • The HSPICE simulation under the 32 nm PTM shows the proposed structure fully tolerates the QNU and is QNU self-recoverable. • PVT variation analysis indicates that LQNTL has stability on delay and power consumption. • Compared with the recent QNU self-recoverable latch named QNURL, LQNTL reduces power consumption, delay, PDP, and area overhead by 69.76%, 6.35%, 71.68%, and 10%, respectively. [ABSTRACT FROM AUTHOR]