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Three-dimensional inhomogeneity of zeolite structure and composition revealed by electron ptychography.
- Source :
-
Science . 5/12/2023, Vol. 380 Issue 6645, p633-638. 6p. 5 Color Photographs. - Publication Year :
- 2023
-
Abstract
- Structural and compositional inhomogeneity is common in zeolites and considerably affects their properties. Thickness-limited lateral resolution, lack of depth resolution, and electron dose-constrained focusing limit local structural studies of zeolites in conventional transmission electron microscopy (TEM). We demonstrate that a multislice ptychography method based on four-dimensional scanning TEM (4D-STEM) data can overcome these limitations. Images obtained from a ~40-nanometer-thick MFI zeolite exhibited a lateral resolution of ~0.85 angstrom that enabled the identification of individual framework oxygen (O) atoms and the precise determination of the orientations of adsorbed molecules. Furthermore, a depth resolution of ~6.6 nanometers allowed probing of the three-dimensional distribution of O vacancies, as well as the phase boundaries in intergrown MFI and MEL zeolites. The 4D-STEM ptychography can be generally applied to other materials with similar high electron-beam sensitivity. [ABSTRACT FROM AUTHOR]
- Subjects :
- *ZEOLITES
*TRANSMISSION electron microscopy
*ELECTRONS
Subjects
Details
- Language :
- English
- ISSN :
- 00368075
- Volume :
- 380
- Issue :
- 6645
- Database :
- Academic Search Index
- Journal :
- Science
- Publication Type :
- Academic Journal
- Accession number :
- 163650242
- Full Text :
- https://doi.org/10.1126/science.adg3183