Transitions between surface force- and inertia-dominant contact dynamics regimes in high-speed scanning probe microscopy.

In contact mode scanning probe microscopy (SPM), the microcantilever probe's dynamics are governed by the (short-range) surface interaction forces, where the tip is "always-in-contact" with the sample. In intermittent contact modes such as "tapping" or bimodal SPM, on the other hand, these are governed by the frequency of the microcantilever's own external excitation. However, when contact mode is employed with high scan speeds (for "video-rate" SPM), we see intermittent transitions—within a single oscillation cycle—between the "always-in-contact" regime and another which is dominated by the microcantilever's inertia. We find—through experiments and physical modeling—that the fast in-plane motion of the sample relative to the probe results in a high surface excitation frequency v / λ (and its harmonics), which excite the microcantilever's out-of-plane eigenmodes and cause it to "break free" of the surface and "overshoot" and "parachute." The impacts of the tip that consequently occur upon the sample inject energy over a wide frequency band into the higher eigenmodes, especially when operating in a low dissipation ambient environment. The microcantilever, then, exhibits phenomena such as eigenmode switching, sidebands, and fractional and combination resonances; such behavior is not seen in, say, tapping mode SPM, since, there, energy is injected at an externally-determined temporal rate. This article investigates the transition from the dynamics of the microcantilever at low speeds to that exhibited at high speeds. The model for dynamic contact loss is validated against the experiments and can be used to propose mitigation of such dynamics in order to achieve high-resolution imaging. [ABSTRACT FROM AUTHOR]