Back to Search Start Over

A Novel Avalanche Transistor-Based Nanosecond Pulse Generator With a Wide Working Range and High Reliability.

Authors :
Cheng, Le
Chen, Zhiqiang
Wang, Haiyang
Guo, Fan
Wu, Gang
Xie, Linshen
Xiao, Jing
Wang, Yanan
Shen, Saikang
Ding, Weidong
Source :
IEEE Transactions on Instrumentation & Measurement. 2021, Vol. 70, p1-14. 14p.
Publication Year :
2021

Abstract

Avalanche transistor (AT)-based repetitive nanosecond pulse generators with high amplitude, fast rise time, narrow pulse width, and low jitter have been widely developed and applied in numerous fields. However, relatively little research has been carried out on the positive nanosecond pulse generation with high flexibility in a wide range of output voltage amplitude. In this article, a novel AT-based Marx circuit (MC) topology adopting base-triggering method is proposed to avoid the formation of current filamentation inside the transistors and resolve the contradiction between high-voltage output and high repetition rate operation. A $6\times 10$ -stage MC prototype is implemented with optimized parameters to validate the feasibility of the proposed topology. The conduction processes of transistors show that, with the injection of additional base current, the switched-ON modes are transformed, which contributes to reliable conduction of transistors even without sufficient overvoltage ramp. With the adoption of inner triggering loops, the minimum working voltage of the prototype is extended to 1150 V. The operation characteristics of the generator in the whole operation range are investigated in depth. Experimental results illustrate that, at the 75- $\Omega $ match-ended coaxial cable, the prototype is capable of generating positive pulses with an adjustable voltage amplitude in the range of 6.50 to 12.39 kV, a basically consistent rise time of 3.6 ns and pulse width of 19.5 ns. Over 107 successive pulses are generated at a maximum repetition rate of 1 kHz without any device failure. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189456
Volume :
70
Database :
Academic Search Index
Journal :
IEEE Transactions on Instrumentation & Measurement
Publication Type :
Academic Journal
Accession number :
170415446
Full Text :
https://doi.org/10.1109/TIM.2021.3075434