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Electron thermalization length in solid para-hydrogen at low-temperature.
- Source :
-
Journal of Chemical Physics . 9/14/2023, Vol. 159 Issue 10, p1-7. 7p. - Publication Year :
- 2023
-
Abstract
- We report the first ever measurements of the thermalization length of low-energy electrons injected into solid para-hydrogen at a temperature T ≈ 2.8 K. The use of the pulsed Townsend photoinjection technique has allowed us to investigate the behavior of quasi-free electrons rather than of massive, slow negative charges, as reported in all previous literature. We have found an average thermalization length ⟨z0⟩ = 26.1 nm, which is three to five times longer than that in liquid helium at the same temperature. [ABSTRACT FROM AUTHOR]
- Subjects :
- *ELECTRONS
*LIQUID helium
*LENGTH measurement
*ELECTRON temperature
Subjects
Details
- Language :
- English
- ISSN :
- 00219606
- Volume :
- 159
- Issue :
- 10
- Database :
- Academic Search Index
- Journal :
- Journal of Chemical Physics
- Publication Type :
- Academic Journal
- Accession number :
- 171962249
- Full Text :
- https://doi.org/10.1063/5.0163776