Back to Search
Start Over
Full-field hard X-ray nano-tomography at SSRF.
- Source :
-
Journal of Synchrotron Radiation . Jul2023, Vol. 30 Issue 4, p815-821. 7p. - Publication Year :
- 2023
-
Abstract
- An in-house designed transmission X-ray microscopy (TXM) instrument has been developed and commissioned at beamline BL18B of the Shanghai Synchrotron Radiation Facility (SSRF). BL18B is a hard (5-14 keV) X-ray bending-magnet beamline recently built with sub-20 nm spatial resolution in TXM. There are two kinds of resolution mode: one based on using a highresolution-based scintillator-lens-coupled camera, and the other on using a medium-resolution-based X-ray sCMOS camera. Here, a demonstration of full-field hard X-ray nano-tomography for high-Z material samples (e.g. Au particles, battery particles) and low-Z material samples (e.g. SiO2 powders) is presented for both resolution modes. Sub-50 nm to 100 nm resolution in three dimensions (3D) has been achieved. These results represent the ability of 3D non-destructive characterization with nano-scale spatial resolution for scientific applications in many research fields. [ABSTRACT FROM AUTHOR]
- Subjects :
- *SYNCHROTRON radiation
*SPATIAL resolution
*X-ray microscopy
*X-rays
*HARD X-rays
Subjects
Details
- Language :
- English
- ISSN :
- 09090495
- Volume :
- 30
- Issue :
- 4
- Database :
- Academic Search Index
- Journal :
- Journal of Synchrotron Radiation
- Publication Type :
- Academic Journal
- Accession number :
- 172258869
- Full Text :
- https://doi.org/10.1107/S1600577523003168