A novel method to characterize the residual stress on the fused silica surface based on the evolution of the atomic point defects.

MLA

Yang, Dinghuai, et al. “A Novel Method to Characterize the Residual Stress on the Fused Silica Surface Based on the Evolution of the Atomic Point Defects.” Applied Surface Science, vol. 640, Dec. 2023, p. N.PAG. EBSCOhost, https://doi.org/10.1016/j.apsusc.2023.158323.

APA

Yang, D., Zhao, L., Chen, M., Cheng, J., Liu, H., Wang, J., Han, C., & Sun, Y. (2023). A novel method to characterize the residual stress on the fused silica surface based on the evolution of the atomic point defects. Applied Surface Science, 640, N.PAG. https://doi.org/10.1016/j.apsusc.2023.158323

Chicago

Yang, Dinghuai, Linjie Zhao, Mingjun Chen, Jian Cheng, Henan Liu, Jinghe Wang, Chengshun Han, and Yazhou Sun. 2023. “A Novel Method to Characterize the Residual Stress on the Fused Silica Surface Based on the Evolution of the Atomic Point Defects.” Applied Surface Science 640 (December): N.PAG. doi:10.1016/j.apsusc.2023.158323.