Cite
Accurate X‐ray diffraction data required for proper evaluation of bond valence sums and global instability indexes: redetermination of the crystal structures of diamond‐like Cu2CdSiS4 and Cu2HgSnS4 as a case study
MLA
Treece, Megan M., et al. “Accurate X‐ray Diffraction Data Required for Proper Evaluation of Bond Valence Sums and Global Instability Indexes: Redetermination of the Crystal Structures of Diamond‐like Cu2CdSiS4 and Cu2HgSnS4 as a Case Study.” Acta Crystallographica Section C: Structural Chemistry, vol. 79, no. 9, Sept. 2023, pp. 353–64. EBSCOhost, https://doi.org/10.1107/S2053229623006848.
APA
Treece, M. M., Kelly, J. C., Rosello, K. E., Craig, A. J., & Aitken, J. A. (2023). Accurate X‐ray diffraction data required for proper evaluation of bond valence sums and global instability indexes: redetermination of the crystal structures of diamond‐like Cu2CdSiS4 and Cu2HgSnS4 as a case study. Acta Crystallographica Section C: Structural Chemistry, 79(9), 353–364. https://doi.org/10.1107/S2053229623006848
Chicago
Treece, Megan M., Jordan C. Kelly, Kate E. Rosello, Andrew J. Craig, and Jennifer A. Aitken. 2023. “Accurate X‐ray Diffraction Data Required for Proper Evaluation of Bond Valence Sums and Global Instability Indexes: Redetermination of the Crystal Structures of Diamond‐like Cu2CdSiS4 and Cu2HgSnS4 as a Case Study.” Acta Crystallographica Section C: Structural Chemistry 79 (9): 353–64. doi:10.1107/S2053229623006848.