Transmission Porosimetry Study on High‐quality Zr‐fum‐MOF Thin Films.

Crystalline Zr‐fum‐MOF (MOF‐801) thin films of high quality are prepared on glass and silicon substrates by direct growth under solvothermal conditions. The synthesis is described in detail and the influence of different synthesis parameters such as temperature, precursor concentration, and the substrate type on the quality of the coatings is illustrated. Zr‐fum‐MOF thin films are characterized in terms of crystallinity, porosity, and homogeneity. Dense films of optical quality are obtained. The sorption behavior of the thin films is studied with various adsorptives. It can be easily monitored by measuring the transmission of the films in gas flows of different compositions. This simple transmission measurement at only one wavelength allows a very fast evaluation of the adsorption properties of thin films as compared to traditional sorption methods. The sorption behavior of the thin films is compared with the sorption properties of Zr‐fum‐MOF powder samples. [ABSTRACT FROM AUTHOR]