Cite
Experimental Verification of a New Oscillation-based Test Algorithm for Analog Circuits.
MLA
Parai, M., et al. “Experimental Verification of a New Oscillation-Based Test Algorithm for Analog Circuits.” IETE Journal of Research, vol. 69, no. 9, Sept. 2023, pp. 6255–65. EBSCOhost, https://doi.org/10.1080/03772063.2021.1994040.
APA
Parai, M., Srimani, S., Ghosh, K., & Rahaman, H. (2023). Experimental Verification of a New Oscillation-based Test Algorithm for Analog Circuits. IETE Journal of Research, 69(9), 6255–6265. https://doi.org/10.1080/03772063.2021.1994040
Chicago
Parai, M., S. Srimani, K. Ghosh, and H. Rahaman. 2023. “Experimental Verification of a New Oscillation-Based Test Algorithm for Analog Circuits.” IETE Journal of Research 69 (9): 6255–65. doi:10.1080/03772063.2021.1994040.