Anisotropic electronic structure of NaAlSi studied by angle-resolved soft x-ray emission spectroscopy.

MLA

Ebisu, Ryogo, et al. “Anisotropic Electronic Structure of NaAlSi Studied by Angle-Resolved Soft x-Ray Emission Spectroscopy.” Journal of Applied Physics, vol. 134, no. 21, Dec. 2023, pp. 1–8. EBSCOhost, https://doi.org/10.1063/5.0178436.

APA

Ebisu, R., Sato, Y. K., Yamada, T., & Terauchi, M. (2023). Anisotropic electronic structure of NaAlSi studied by angle-resolved soft x-ray emission spectroscopy. Journal of Applied Physics, 134(21), 1–8. https://doi.org/10.1063/5.0178436

Chicago

Ebisu, Ryogo, Yohei K. Sato, Takahiro Yamada, and Masami Terauchi. 2023. “Anisotropic Electronic Structure of NaAlSi Studied by Angle-Resolved Soft x-Ray Emission Spectroscopy.” Journal of Applied Physics 134 (21): 1–8. doi:10.1063/5.0178436.