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At-wavelength characterization of X-ray wavefronts in Bragg diffraction from crystals.
- Source :
-
Journal of Synchrotron Radiation . Nov2023, Vol. 30 Issue 6, p1100-1107. 8p. - Publication Year :
- 2023
-
Abstract
- The advent of next-generation synchrotron radiation sources and X-ray freeelectron lasers calls for high-quality Bragg-diffraction crystal optics to preserve the X-ray beam coherence and wavefront. This requirement brings new challenges in characterizing crystals in Bragg diffraction in terms of Bragg-plane height errors and wavefront phase distortions. Here, a quantitative methodology to characterize crystal optics using a state-of-the-art at-wavelength wavefront sensing technique and statistical analysis is proposed. The method was tested at the 1-BM-B optics testing beamline at the Advanced Photon Source for measuring silicon and diamond crystals in a self-referencing single-crystal mode and an absolute double-crystal mode. The phase error sensitivity of the technique is demonstrated to be at the λ/100 level required by most applications, such as the characterization of diamond crystals for cavity-based X-ray freeelectron lasers. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 09090495
- Volume :
- 30
- Issue :
- 6
- Database :
- Academic Search Index
- Journal :
- Journal of Synchrotron Radiation
- Publication Type :
- Academic Journal
- Accession number :
- 174110122
- Full Text :
- https://doi.org/10.1107/S1600577523007531