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Discussion on the relationship between Δ VEBEB and IE presented in thermal resistance standard IEC60747-7 Version 2000.
- Source :
-
Progress in Natural Science . Apr2005, Vol. 15 Issue 4, p380-384. 5p. - Publication Year :
- 2005
-
Abstract
- This paper points out an error in the principle figure and the waveform figure of the thermal resistance standard [EC747- 7, which describes the relation between the I-V curves and the temperature. It theoretically proves that the I-V-T curve of the standard contradicts the physical law. This contradiction is also revealed by experimental results. Finally, the correct I-V-T characteristic curve and the waveform figure at two different temperatures for the same transistor is given, which serves as the reference to correct the standard. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 10020071
- Volume :
- 15
- Issue :
- 4
- Database :
- Academic Search Index
- Journal :
- Progress in Natural Science
- Publication Type :
- Academic Journal
- Accession number :
- 17430312
- Full Text :
- https://doi.org/10.1080/10020070512331342270