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Discussion on the relationship between Δ VEBEB and IE presented in thermal resistance standard IEC60747-7 Version 2000.

Authors :
Qinghai, Miao
Yuan, Miao
Yangjun, Zhu
Xinghua, Zhang
Lieyong, Yang
Zhiwei, Yang
Dejun, Zhang
Fengxia, Chen
Shuojin, Lu
Source :
Progress in Natural Science. Apr2005, Vol. 15 Issue 4, p380-384. 5p.
Publication Year :
2005

Abstract

This paper points out an error in the principle figure and the waveform figure of the thermal resistance standard [EC747- 7, which describes the relation between the I-V curves and the temperature. It theoretically proves that the I-V-T curve of the standard contradicts the physical law. This contradiction is also revealed by experimental results. Finally, the correct I-V-T characteristic curve and the waveform figure at two different temperatures for the same transistor is given, which serves as the reference to correct the standard. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
10020071
Volume :
15
Issue :
4
Database :
Academic Search Index
Journal :
Progress in Natural Science
Publication Type :
Academic Journal
Accession number :
17430312
Full Text :
https://doi.org/10.1080/10020070512331342270