To Achieve the Grazing-Incidence Small-Angle Neutron Scattering on a Pinhole SANS.

This article discusses the addition of grazing incidence small-angle neutron scattering (GISANS) geometry to a standard pinhole small-angle neutron scattering (SANS) setup. GISANS is a surface-sensitive technique that can be used to investigate thin films. The article describes the addition of XY slits and a sample mount to achieve GISANS measurements on a pinhole SANS spectrometer. The article also explains the basic principles of SANS and GISANS and provides information on sample stages and experimental conditions for GISANS measurements. The article concludes by highlighting the need for further research and analytical methods for analyzing GISANS data. [Extracted from the article]