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2022 JETTA-TTTC Best Paper Award: Zhi-Wei Lai, Po-Hua Huang, and Kuen-Jong Lee, "Using both Stable and Unstable SRAM Bits for the Physical Unclonable Function," Journal of Electronic Testing: Theory and Applications, Volume 38, Number 5, pp. 511–525, October 2022

Source :
Journal of Electronic Testing. Dec2023, Vol. 39 Issue 5/6, p537-538. 2p.
Publication Year :
2023

Abstract

The article discusses the use of Physical Unclonable Functions (PUFs) in electronic systems for secret key generation and device authentication. Specifically, it focuses on the use of SRAM PUFs, which are popular due to the randomness they possess during power-on. The authors propose two methods that utilize both stable and unstable SRAM bits as PUF bits to increase the usage rate of SRAM bits and resist PUF clone attacks. Extensive experiments have been conducted to demonstrate the effectiveness of these methods. The article also provides brief biographies of the authors. [Extracted from the article]

Details

Language :
English
ISSN :
09238174
Volume :
39
Issue :
5/6
Database :
Academic Search Index
Journal :
Journal of Electronic Testing
Publication Type :
Academic Journal
Accession number :
174953695
Full Text :
https://doi.org/10.1007/s10836-023-06094-3