Low temperature relaxor behaviour of SrBi1.5La0.5Nb2O9 ceramics.

Bismuth layered compound with the composition SrBi1.5La0.5Nb2O9 has been prepared using conventional solid-state reaction method. Crystallographic planes have been identified using X-ray diffraction studies. The dielectric studies have been done as a function of frequency and temperature. Low temperature dielectric measurement shows phase transition in which peak dielectric constant shifts from 260K to 280K with the increase in frequency from 1 kHz to 1 MHz. Room temperature dielectric constant has been found to be nearly frequency independent for this composition making it a potential candidate for the capacitor applications. The prepared ceramic was modelled using the Vogel – Fulcher relationship. [ABSTRACT FROM AUTHOR]