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Photocatalytic degradation performance for high-entropy oxide (La0.2Ce0.2Gd0.2Zr0.2Fex)O2 enriched with defects.

Authors :
Jia, Dongjie
Chigan, Tonglin
Li, Xianyu
Li, Haibo
Yang, Peipei
Source :
Journal of Alloys & Compounds. Apr2024, Vol. 982, pN.PAG-N.PAG. 1p.
Publication Year :
2024

Abstract

High-entropy oxides (HEOs) have been considered promising novel photocatalytic materials due to their tunable compositions, bandgaps, and excellent thermal stability. Investigating the effects of molar ratio of single atoms in HEOs on their crystal structure, defects, and band structures is crucial for realizing their potential photocatalytic applications. We designed and synthesized (La 0.2 Ce 0.2 Gd 0.2 Zr 0.2 Fe x)O 2 HEOs by varying the molar ratio of Fe to study its influence on the atomic arrangement, crystal structure, defects, and optoelectronic properties. With increasing molar ratio of Fe, the valence band position of (La 0.2 Ce 0.2 Gd 0.2 Zr 0.2 Fe x)O 2 gradually decreased, the crystal structure became more ordered, and the defects decreased. Among them, (La 0.2 Ce 0.2 Gd 0.2 Zr 0.2 Fe 0.05)O 2 (H-1) had an appropriate band structure and abundant defects, exhibiting excellent photocatalytic performance. The results showed that the degradation rate of tetracycline reached 95.4% under visible light irradiation for 3 h. After five cycles, its structure and photocatalytic performance remained unchanged. This study lays the foundation for further exploration and optimization of high-entropy oxides for photocatalytic applications. • The Fe ratio impacts (La 0.2 Ce 0.2 Gd 0.2 Zr 0.2 Fe x)O 2 's structure, defects, and bandgap. • Defects in high-entropy oxides impact photogenerated carrier transport. • (La 0.2 Ce 0.2 Gd 0.2 Zr 0.2 Fe x)O 2 has excellent photocatalytic degradation of TCH. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
09258388
Volume :
982
Database :
Academic Search Index
Journal :
Journal of Alloys & Compounds
Publication Type :
Academic Journal
Accession number :
175696741
Full Text :
https://doi.org/10.1016/j.jallcom.2024.173808