Cite
A zircon LA-ICPMS reverse depth profiling analysis method and its geological application.
MLA
Lu, Yao, et al. “A Zircon LA-ICPMS Reverse Depth Profiling Analysis Method and Its Geological Application.” JAAS (Journal of Analytical Atomic Spectrometry), vol. 39, no. 3, Mar. 2024, pp. 829–40. EBSCOhost, https://doi.org/10.1039/d3ja00309d.
APA
Lu, Y., Zhang, L.-L., Liu, L., Zhu, D.-C., Xie, J.-C., & Wang, Q. (2024). A zircon LA-ICPMS reverse depth profiling analysis method and its geological application. JAAS (Journal of Analytical Atomic Spectrometry), 39(3), 829–840. https://doi.org/10.1039/d3ja00309d
Chicago
Lu, Yao, Liang-Liang Zhang, Li Liu, Di-Cheng Zhu, Jin-Cheng Xie, and Qing Wang. 2024. “A Zircon LA-ICPMS Reverse Depth Profiling Analysis Method and Its Geological Application.” JAAS (Journal of Analytical Atomic Spectrometry) 39 (3): 829–40. doi:10.1039/d3ja00309d.