Back to Search Start Over

Growth and Characterization of ß-HgS Thin Films by Annealing Hg 2+ -Dithiol Self-Assembled Multilayers.

Authors :
Mu, Jin
Zhang, Yunyan
Wang, Yanping
Source :
Journal of Dispersion Science & Technology. Sep2005, Vol. 26 Issue 5, p641-644. 4p.
Publication Year :
2005

Abstract

Hg 2+ ‐dithiol self‐assembled multilayers were constructed by alternatively depositing mercury ion and 1, 6‐hexanedithiol. Cubic β‐HgS thin films were obtained by annealing the self‐assembled Hg 2+ ‐dithiol multilayers at 503 K for 2 h. The grain size was estimated to be 16 nm by use of the Scherrer formula from the XRD pattern. The HgS thin films showed a blue shift in band gap energy due to small grain size. The sheet resistance of the film was sensitive to UV light and the dark resistance was 4.84×10 4 Ω/ 2 . [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
01932691
Volume :
26
Issue :
5
Database :
Academic Search Index
Journal :
Journal of Dispersion Science & Technology
Publication Type :
Academic Journal
Accession number :
17601420
Full Text :
https://doi.org/10.1081/DIS-200057692