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Growth and Characterization of ß-HgS Thin Films by Annealing Hg 2+ -Dithiol Self-Assembled Multilayers.
- Source :
-
Journal of Dispersion Science & Technology . Sep2005, Vol. 26 Issue 5, p641-644. 4p. - Publication Year :
- 2005
-
Abstract
- Hg 2+ ‐dithiol self‐assembled multilayers were constructed by alternatively depositing mercury ion and 1, 6‐hexanedithiol. Cubic β‐HgS thin films were obtained by annealing the self‐assembled Hg 2+ ‐dithiol multilayers at 503 K for 2 h. The grain size was estimated to be 16 nm by use of the Scherrer formula from the XRD pattern. The HgS thin films showed a blue shift in band gap energy due to small grain size. The sheet resistance of the film was sensitive to UV light and the dark resistance was 4.84×10 4 Ω/ 2 . [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 01932691
- Volume :
- 26
- Issue :
- 5
- Database :
- Academic Search Index
- Journal :
- Journal of Dispersion Science & Technology
- Publication Type :
- Academic Journal
- Accession number :
- 17601420
- Full Text :
- https://doi.org/10.1081/DIS-200057692