Cite
High resolution magnetic field imaging probe with two rows of TMR sensors for small defects inspection.
MLA
Long, Cai, et al. “High Resolution Magnetic Field Imaging Probe with Two Rows of TMR Sensors for Small Defects Inspection.” International Journal of Applied Electromagnetics & Mechanics, vol. 74, no. 4, Apr. 2024, pp. 299–306. EBSCOhost, https://doi.org/10.3233/JAE-230115.
APA
Long, C., Wang, Y., Dong, H., Tao, Y., & Ye, C. (2024). High resolution magnetic field imaging probe with two rows of TMR sensors for small defects inspection. International Journal of Applied Electromagnetics & Mechanics, 74(4), 299–306. https://doi.org/10.3233/JAE-230115
Chicago
Long, Cai, Yuanyuan Wang, Haoran Dong, Yu Tao, and Chaofeng Ye. 2024. “High Resolution Magnetic Field Imaging Probe with Two Rows of TMR Sensors for Small Defects Inspection.” International Journal of Applied Electromagnetics & Mechanics 74 (4): 299–306. doi:10.3233/JAE-230115.