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Trap-assisted tunneling in type II Ag2O/β-Ga2O3 self-powered solar blind photodetector.

Authors :
Labed, Madani
Kim, Kihwan
Kim, Kyung Hwan
Hong, Jeongsoo
Rim, You Seung
Source :
Sensors & Actuators A: Physical. Jul2024, Vol. 372, pN.PAG-N.PAG. 1p.
Publication Year :
2024

Abstract

This study investigates a high-performance Ag 2 O/β-Ga 2 O 3 self-powered photodiode through experimental and modeling approaches. Initially, a p-type Ag 2 O film, with a bandgap close to 4 eV and a hole density of approximately 6.35×1018 cm−3, was fabricated using faced two-target sputtering. The conduction and valence band offsets between Ag 2 O and β-Ga 2 O 3 were determined via X-ray photoelectron spectroscopy, confirming a type II heterojunction. The device had a low on-voltage of 1.50 V and a low on-resistance of 5.40 mΩ.cm² in the dark. Subsequent illumination at 254 nm resulted in a notably high photocurrent, responsivity, and detectivity. To confirm the role of trap-assisted tunneling in the type II Ag 2 O/β-Ga 2 O 3 heterojunction, Silvaco simulations were employed to model both the dark current and photocurrent. These simulations confirmed the prevalence of the trap-assisted tunneling mechanism, particularly through energy levels situated above the equilibrium Fermi level at the Ag 2 O/β-Ga 2 O 3 interface, as described by the Danielsson model. Understanding the transport mechanism is paramount for the development of high-performance photodetectors. By comprehending how charge carriers navigate through the device and the influence of traps on their behavior, researchers can optimize device design and fabrication processes to enhance performance. [Display omitted] • Demonstration of ultra-high bandgap (4 eV) P-type Ag 2 O deposited on β-Ga 2 O 3 • Type II Ag 2 O/β-Ga 2 O 3 heterojunction was demonstrated using X-ray photoelectron spectroscopy analysis. • High performance Ag 2 O/β-Ga 2 O 3 heterojunction and self-powered photodetector was validated. • Silvaco TCAD was utilized to confirm the role of trap-assisted tunneling mechanisms in carrier injection. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
09244247
Volume :
372
Database :
Academic Search Index
Journal :
Sensors & Actuators A: Physical
Publication Type :
Academic Journal
Accession number :
176864870
Full Text :
https://doi.org/10.1016/j.sna.2024.115368