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Gain Coefficient Comparison between Silicon and InP Laser Diode Substrate.
- Source :
-
Physica Status Solidi. A: Applications & Materials Science . May2024, Vol. 221 Issue 9, p1-6. 6p. - Publication Year :
- 2024
-
Abstract
- The article presents the study on the comparison of gain coefficient of laser diode on silicon and InP substrate. Fabry–Perot GaInAsP bulk laser diode on InP/Si substrate is successfully obtained to study the optical gain coefficient of laser diode. The influences of temperature, threshold current comparison, and optical gain achievements between bulk InP/Si laser diode substrate and InP laser diode substrate are also analyzed using the same growth structure. A new approach is found by the research group which involves bonding of 1 μm InP semiconductor crystal and a low‐cost silicon crystal prior to epitaxial laser structure growth. With the help of metal–organic vapor‐phase epitaxy technique, GaInAsP double‐heterostructure laser is epitaxially deposited on the well‐bonded InP/Si crystal. Fabry–Perot lasing under pulsed condition is achieved, and the lasing characteristics of InP/Si substrate are compared with that of InP laser device to study the gain coefficient. [ABSTRACT FROM AUTHOR]
- Subjects :
- *SILICON crystals
*SILICON diodes
*SEMICONDUCTOR lasers
*SILICON
*EPITAXY
*LASERS
Subjects
Details
- Language :
- English
- ISSN :
- 18626300
- Volume :
- 221
- Issue :
- 9
- Database :
- Academic Search Index
- Journal :
- Physica Status Solidi. A: Applications & Materials Science
- Publication Type :
- Academic Journal
- Accession number :
- 177114268
- Full Text :
- https://doi.org/10.1002/pssa.202300677