Cite
Polarization-multiplexed snapshot lateral shearing interferometric sensor for surface roughness measurements.
MLA
Park, Hyo Mi, et al. “Polarization-Multiplexed Snapshot Lateral Shearing Interferometric Sensor for Surface Roughness Measurements.” Optics & Lasers in Engineering, vol. 179, Aug. 2024, p. N.PAG. EBSCOhost, https://doi.org/10.1016/j.optlaseng.2024.108272.
APA
Park, H. M., Mayer, L. D., Kim, D., & Joo, K.-N. (2024). Polarization-multiplexed snapshot lateral shearing interferometric sensor for surface roughness measurements. Optics & Lasers in Engineering, 179, N.PAG. https://doi.org/10.1016/j.optlaseng.2024.108272
Chicago
Park, Hyo Mi, Luke D. Mayer, Daewook Kim, and Ki-Nam Joo. 2024. “Polarization-Multiplexed Snapshot Lateral Shearing Interferometric Sensor for Surface Roughness Measurements.” Optics & Lasers in Engineering 179 (August): N.PAG. doi:10.1016/j.optlaseng.2024.108272.