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Be My Guesses: The interplay between side-channel leakage metrics.

Authors :
Béguinot, Julien
Cheng, Wei
Guilley, Sylvain
Rioul, Olivier
Source :
Microprocessors & Microsystems. Jun2024, Vol. 107, pN.PAG-N.PAG. 1p.
Publication Year :
2024

Abstract

In a theoretical context of side-channel attacks, optimal bounds between success rate, guessing entropy and statistical distance are derived with a simple majorization (Schur-concavity) argument. They are further theoretically refined for different versions of the classical Hamming weight leakage model, in particular assuming a priori equiprobable secret keys and additive white Gaussian measurement noise. Closed-form expressions and numerical computation are given. A study of the impact of the choice of the substitution box with respect to side-channel resistance reveals that its nonlinearity tends to homogenize the expressivity of success rate, guessing entropy and statistical distance. The intriguing approximate relation between guessing entropy and success rate G E = 1 / S R is observed in the case of 8-bit bytes and low noise. The exact relation between guessing entropy, statistical distance and alphabet size G E = M + 1 2 − M 2 S D for deterministic leakages and equiprobable keys is proved. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
01419331
Volume :
107
Database :
Academic Search Index
Journal :
Microprocessors & Microsystems
Publication Type :
Academic Journal
Accession number :
177392363
Full Text :
https://doi.org/10.1016/j.micpro.2024.105045