Cite
AENet: attention enhancement network for industrial defect detection in complex and sensitive scenarios.
MLA
Wan, Yi, et al. “AENet: Attention Enhancement Network for Industrial Defect Detection in Complex and Sensitive Scenarios.” Journal of Supercomputing, vol. 80, no. 9, June 2024, pp. 11845–68. EBSCOhost, https://doi.org/10.1007/s11227-024-05898-0.
APA
Wan, Y., Yi, L., Jiang, B., Chen, J., Jiang, Y., & Xie, X. (2024). AENet: attention enhancement network for industrial defect detection in complex and sensitive scenarios. Journal of Supercomputing, 80(9), 11845–11868. https://doi.org/10.1007/s11227-024-05898-0
Chicago
Wan, Yi, Lingjie Yi, Bo Jiang, Junfan Chen, Yi Jiang, and Xianzhong Xie. 2024. “AENet: Attention Enhancement Network for Industrial Defect Detection in Complex and Sensitive Scenarios.” Journal of Supercomputing 80 (9): 11845–68. doi:10.1007/s11227-024-05898-0.