Cite
The Force–Frequency Characteristics of Quartz Wafers under a Cantilever Beam Structure.
MLA
Shen, Junquan, et al. “The Force–Frequency Characteristics of Quartz Wafers under a Cantilever Beam Structure.” Sensors (14248220), vol. 24, no. 11, June 2024, p. 3359. EBSCOhost, https://doi.org/10.3390/s24113359.
APA
Shen, J., Chen, C.-Y., Wu, C.-Y., Cheng, J., Chao, M.-C., Zhou, Q., & Lu, C. (2024). The Force–Frequency Characteristics of Quartz Wafers under a Cantilever Beam Structure. Sensors (14248220), 24(11), 3359. https://doi.org/10.3390/s24113359
Chicago
Shen, Junquan, Chin-Yin Chen, Cheng-Yi Wu, Jiguang Cheng, Min-Chiang Chao, Qiang Zhou, and Congda Lu. 2024. “The Force–Frequency Characteristics of Quartz Wafers under a Cantilever Beam Structure.” Sensors (14248220) 24 (11): 3359. doi:10.3390/s24113359.