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P-Type ZnO Films Made by Atomic Layer Deposition and Ion Implantation.

Authors :
Zhang, Guoxiu
Rebohle, Lars
Ganss, Fabian
Dawidowski, Wojciech
Guziewicz, Elzbieta
Koh, Jung-Hyuk
Helm, Manfred
Zhou, Shengqiang
Liu, Yufei
Prucnal, Slawomir
Source :
Nanomaterials (2079-4991). Jul2024, Vol. 14 Issue 13, p1069. 13p.
Publication Year :
2024

Abstract

Zinc oxide (ZnO) is a wide bandgap semiconductor that holds significant potential for various applications. However, most of the native point defects in ZnO like Zn interstitials typically cause an n-type conductivity. Consequently, achieving p-type doping in ZnO is challenging but crucial for comprehensive applications in the field of optoelectronics. In this work, we investigated the electrical and optical properties of ex situ doped p-type ZnO films. The p-type conductivity has been realized by ion implantation of group V elements followed by rapid thermal annealing (RTA) for 60 s or flash lamp annealing (FLA) on the millisecond time scale in nitrogen or oxygen ambience. The phosphorus (P)-doped ZnO films exhibit stable p-type doping with a hole concentration in the range of 1014 to 1018 cm−3, while antimony (Sb) implantation produces only n-type layers independently of the annealing procedure. Microstructural studies of Sb-doped ZnO show the formation of metallic clusters after ms range annealing and SbZn-oxides after RTA. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
20794991
Volume :
14
Issue :
13
Database :
Academic Search Index
Journal :
Nanomaterials (2079-4991)
Publication Type :
Academic Journal
Accession number :
178412208
Full Text :
https://doi.org/10.3390/nano14131069