High Energy X-Ray Source Characterization at 0.450, 3, 6, 9, and 15 MVp.

MLA

Hellmann, David, et al. “High Energy X-Ray Source Characterization at 0.450, 3, 6, 9, and 15 MVp.” Journal of Nondestructive Evaluation, vol. 43, no. 3, Sept. 2024, pp. 1–13. EBSCOhost, https://doi.org/10.1007/s10921-024-01068-7.

APA

Hellmann, D., Liesenfelt, M., & Hayward, J. P. (2024). High Energy X-Ray Source Characterization at 0.450, 3, 6, 9, and 15 MVp. Journal of Nondestructive Evaluation, 43(3), 1–13. https://doi.org/10.1007/s10921-024-01068-7

Chicago

Hellmann, David, Michael Liesenfelt, and Jason P. Hayward. 2024. “High Energy X-Ray Source Characterization at 0.450, 3, 6, 9, and 15 MVp.” Journal of Nondestructive Evaluation 43 (3): 1–13. doi:10.1007/s10921-024-01068-7.