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Reliability analysis for degradation process with abrupt jumps caused by operation state transition.

Authors :
Cao, Shihao
Wang, Zhihua
Liu, Chengrui
Wu, Qiong
Ouyang, Xiangmin
Source :
Applied Mathematical Modelling. Oct2024, Vol. 134, p776-796. 21p.
Publication Year :
2024

Abstract

• A novel degradation process with abrupt jumps caused by operation state transition is proposed. • Analytical reliability solutions of the model are derived in the form of one-dimensional Laplace-Stieltjes transform. • The limit reliability solutions are investigated, as alternative strategy under long-term service. • Analytical solutions regarding statistical characteristics of degradation amount during regeneration epoch are proposed. • The case of spool valve is implemented to verify the effectiveness and the feasibility of the solutions. This paper proposes a novel type of degradation process incorporating continuous degradation and abrupt degradation jump under dynamic operation states. By analyzing the failure mechanism of practical application, the abrupt degradation jump is comprehensively considered, and it is triggered by some certain state switching processes. Then, the reliability solutions of the degradation process (reliability function and moments of lifetime) are derived in the form of Laplace-Stieltjes transform. To a further step, inspired by the advanced equipment with long service span, the reliability solutions in limit region are explored, where an effective calculation method regarding statistical characteristics of degradation amount during regeneration epoch is pioneeringly proposed. To verify the proposed solutions in the form of Laplace-Stieltjes transform and their limit case, the representative example, spool valve, is implemented, and the results show the effectiveness and the feasibility of the solutions. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
0307904X
Volume :
134
Database :
Academic Search Index
Journal :
Applied Mathematical Modelling
Publication Type :
Academic Journal
Accession number :
178682177
Full Text :
https://doi.org/10.1016/j.apm.2024.04.041