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Approximation of the Absorption Spectrum of Indium Phosphide in the Context of Simulation of the Process of Sensation.

Authors :
Makarenko, Ph. V.
Zolnikov, V. K.
Zarevich, A. I.
Zalenskaya, N. Yu.
Poluektov, A. V.
Source :
Russian Microelectronics. Aug2024, Vol. 53 Issue 4, p329-338. 10p.
Publication Year :
2024

Abstract

The fundamental properties of indium phosphide (InP) doped with tellurium and, subsequently, compensated with copper are considered. Data are presented on the existence of four qualitative patterns of the empirical photoconductivity (PC) spectra of InP:Cu in its own region. Works with semiempirical approximation of the PC of sensitive InP:Cu samples are indicated. It is noted that the PC of IP(α()) was analytically approximated as a function of the experimentally obtained spectral dependence of the absorption coefficient of InP. Five approximating functions are proposed in order to obtain an analytical dependence of the absorption coefficient of InP α(). Five dependencies with different values of the standard deviation are obtained. Based on the analytical dependencies, the complete analytical dependence of IP(α()) is modeled. Similarly, five dependencies are obtained, characterized by the corresponding value of the standard deviation. Five nonstationary PC surfaces of IP (as a function of two variables: absorption coefficient, as a function of photon energy, and sample exposure time under normal conditions) are constructed. A conclusion is made about the choice of the most mathematically accurate and physically meaningful approximating function α(). Accordingly, it is shown that this dependence is optimal for obtaining based on it (including this dependence in the structure of IP = f(α) and α = f()) a complete analytical description of the PC process. It is shown that subsequent studies can be aimed at explaining the physical bases of PC in the short-wave region of the fundamental transitions of InP and studying methods of influencing the surface layer of InP:Cu, with the aim of sensitizing and stabilizing it. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
10637397
Volume :
53
Issue :
4
Database :
Academic Search Index
Journal :
Russian Microelectronics
Publication Type :
Academic Journal
Accession number :
179815201
Full Text :
https://doi.org/10.1134/S1063739724600481