Effect of multi-temperature models on heat transfer and electron behavior in hypersonic flows.

In hypersonic computational fluid dynamics, the two-temperature (2-T) model is widely used to simulate thermochemical nonequilibrium. The 2-T model incorporates translational-rotational and electron-electronic-vibrational energies, assuming that the integrated energies have the equivalent temperature. In this study, multi-T models are constructed to accurately predict the effects on heat flux and free electrons due to the separation of energy modes under hypersonic environments. The three-temperature (3-T) model separates the electron-electronic energy from the electron-electronic-vibrational energy of the 2-T model. The 3-T model can accurately predict the distribution and temperature of free electrons by separating the energy of free electrons, which has different characteristics from heavy particles. The four-temperature model treats rotational energy as a nonequilibrium energy mode, distinct from translational-rotational energy. While the rotational temperature reaches equilibrium rapidly at low temperatures, at high-temperature regime rotational temperature shows a relaxation time similar to that of vibrational temperature, which cannot be ignored. To develop multi-T models, electron-vibrational relaxation and translational-rotational relaxation, which are omitted in the 2-T model, are considered. Various flight test and ground facility conditions are analyzed to verify the effects of electron and heat flux under circumstances that include shock, expansion, and shock wave boundary layer interaction. The results of the multi-T models show significant differences in electron temperature and distribution caused by electron-electronic nonequilibrium. Additionally, rotational nonequilibrium increases the shock standoff distance and alters the electron distribution at high altitudes. The heat flux difference across multi-T models is found to be negligible, except in the high degree of ionization condition. [ABSTRACT FROM AUTHOR]