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RF Noise Modeling in SiGe HBTs.
- Source :
-
AIP Conference Proceedings . 2005, Vol. 780 Issue 1, p247-252. 6p. - Publication Year :
- 2005
-
Abstract
- This paper presents RF noise modeling in advanced SiGe HBTs using experimental data from 2 to 26 GHz. Several widely used noise models are evaluated, including the conventional SPICE model, the Van Vliet model, the transport noise model, and a recently developed extraction based model. The connections between various models are investigated. © 2005 American Institute of Physics [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 0094243X
- Volume :
- 780
- Issue :
- 1
- Database :
- Academic Search Index
- Journal :
- AIP Conference Proceedings
- Publication Type :
- Conference
- Accession number :
- 18024204
- Full Text :
- https://doi.org/10.1063/1.2036742