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Θ-Net: A Deep Neural Network Architecture for the Resolution Enhancement of Phase-Modulated Optical Micrographs In Silico.

Authors :
Kaderuppan, Shiraz S.
Sharma, Anurag
Saifuddin, Muhammad Ramadan
Wong, Wai Leong Eugene
Woo, Wai Lok
Source :
Sensors (14248220). Oct2024, Vol. 24 Issue 19, p6248. 19p.
Publication Year :
2024

Abstract

Optical microscopy is widely regarded to be an indispensable tool in healthcare and manufacturing quality control processes, although its inability to resolve structures separated by a lateral distance under ~200 nm has culminated in the emergence of a new field named fluorescence nanoscopy, while this too is prone to several caveats (namely phototoxicity, interference caused by exogenous probes and cost). In this regard, we present a triplet string of concatenated O-Net ('bead') architectures (termed 'Θ-Net' in the present study) as a cost-efficient and non-invasive approach to enhancing the resolution of non-fluorescent phase-modulated optical microscopical images in silico. The quality of the afore-mentioned enhanced resolution (ER) images was compared with that obtained via other popular frameworks (such as ANNA-PALM, BSRGAN and 3D RCAN), with the Θ-Net-generated ER images depicting an increased level of detail (unlike previous DNNs). In addition, the use of cross-domain (transfer) learning to enhance the capabilities of models trained on differential interference contrast (DIC) datasets [where phasic variations are not as prominently manifested as amplitude/intensity differences in the individual pixels unlike phase-contrast microscopy (PCM)] has resulted in the Θ-Net-generated images closely approximating that of the expected (ground truth) images for both the DIC and PCM datasets. This thus demonstrates the viability of our current Θ-Net architecture in attaining highly resolved images under poor signal-to-noise ratios while eliminating the need for a priori PSF and OTF information, thereby potentially impacting several engineering fronts (particularly biomedical imaging and sensing, precision engineering and optical metrology). [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
14248220
Volume :
24
Issue :
19
Database :
Academic Search Index
Journal :
Sensors (14248220)
Publication Type :
Academic Journal
Accession number :
180275955
Full Text :
https://doi.org/10.3390/s24196248